Alpha-particle-induced upsets in advanced CMOS circuits and technology, IBM Journal of Research and Development, vol.52, issue.3, 2008. ,
DOI : 10.1147/rd.523.0225
Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM, IEEE Transactions on Nuclear Science, vol.56, issue.6, pp.3499-3504, 2009. ,
DOI : 10.1109/TNS.2009.2033796
Soft Error Sensitivities in 90nm Bulk CMOS SRAMs, Radiation Effects Data Workshop, pp.71-75, 2009. ,
MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications, RADECS, 2009. ,
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions, IEEE Transactions on Nuclear Science, vol.56, issue.6, pp.3085-3092, 2009. ,
DOI : 10.1109/TNS.2009.2032545
Impact of the Solar Flares on the SER dynamics on Micro and Nanometric Technologies in the Geostationary Orbit, IEEE Trans. Nucl. Sci, vol.57, issue.6, pp.3127-3134, 2010. ,
A Calculation Method for Proton Direct Ionization Induced SEU Rate from Experimental Data: Application to a Commercial 45nm FPGA, 2014. ,